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1 nm Repeatability
Replacement Base for 13mm die set
190–800 nm 80 Hz sampling
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Spectral Reflectance Film Thickness Measurement System thin-film ic10-applications { display: gridSpectral Reflectance Technology Precision Film Thickness Measurement Non Contact Nanometer to Micrometer Analysis High precision film thickness measurement based on advanced spectral reflectance technology. Enables accurate, non contact measurement from 5 nm to 250 m across semiconductors, photovoltaics, optical coatings, and biomedical applications. Direct replacement for Filmetrics F20 systems. Request Application Study 0. 1 nm Repeatability 5 nm
US$ 129.00
US$ 199.00
US$ 199.00
US$ 199.00
US$ 179.00
US$ 199.00