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reference datum
semiconductor manufacturers
NOTICE: This Document was balloted and approved for withdrawal in 2004
SEMI G4-94 (technical revision)
Information on the mapping of processing management services to special protocols (e
D06400 - SEMI D64 - Test Method for Measuring the Spatial Contrast Ratio of Flat Panel Display StdTpc-FPD Substrates reference datumContrast has a significant influence on the perceived image quality in display devices. For several decades, physical contrast metrics such as contrast ratio (CR) and contrast modulation (CM) have been widely used to quantify the contrast performance of display devices. A robust standardized test method for measuring the average picture level (APL) contrast ratios of flat panel display (FPD) systems is required to enable quality control in high volume
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