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SEMI F44-0325 (technical revision)
to be published July 2003
Photo alignment mark configuration is the key to ensure consistent and precise alignment of layers
Both automatic and manual process panels are within the scope of this test procedure
org in October 2010
E13400 - SEMI E134 - Specification for Data Collection Management Revision:SEMI E134-0310 - Superseded SEMI F44-0325 (technical revision)* This Standard has the option to purchase the Current document with a redline document (Current + Redline). The redline document is included with the Current document as a comparison tool to help identify changes that have been made between the Current version and the previous version (Superseded). If differences should exist between the redline document and the Current document, the Current version is the official and authoritative version. 1